JEOL: Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)
22.1.2021 09:00:00 EET | Business Wire | Press release
JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images".
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Cold Field Emission Cryo-Electron Microscope CRYO ARM(TM) 300 II (JEM-3300) (Photo: Business Wire)
Development Background
Recent dramatic improvement of resolution in single particle analysis (SPA) using cryo-EM has led to SPA as an essential method for structural analysis of proteins. To address this market, JEOL released the CRYO ARM™ 300 in 2017. Equipped with a cold field emission gun (Cold FEG) for enhanced resolution and a cryo-stage for loading multiple samples, the CRYO ARM™ 300 has continued to achieve best-in-class resolution for SPA.
However, the previous workflow of SPA using cryo-EM needs multiple electron microscopes because the workflows for sample screening and for image data acquisition are independent of one another. This problem gives rise to large operating costs for cryo-EM users. Since multiple microscopes must be used, it is inconvenient to transfer cryo-samples between the cryo-EMs. Therefore, users have been requesting one cryo-EM enabling the complete workflow from sample screening to image data acquisition. Furthermore, in order for various users to use the cryo-EM, an improvement of usability has been required, allowing anyone from novice users to professional users to smoothly operate the microscope.
To meet these requests, JEOL has developed a new cryo-EM, the CRYO ARM™ 300 II. This microscope achieves a great improvement in throughput for high-quality data acquisition with quick and easy operation compared with the previous CRYO ARM™ 300.
Main Features
1. High-speed imaging achieved by optimal electron beam control
2. Improved hardware stability for high-quality image acquisition
3. Higher operability through system improvement
Annual unit sales target
10 units/year
Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)
https://www.jeol.co.jp/en/products/detail/JEM-3300.html
JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & COO
(Stock code: 6951, Tokyo Stock Exchange First Section)
www.jeol.com
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Contact information
JEOL Ltd.
Science and Measurement Instruments Sales Division
Hideya UENO
+81-3-6262-3567
https://www.jeol.co.jp/en/support/support_system/contact_products.html
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